Fault-Based Test Case Generation for Component Connectors

B. K. Aichernig, F. Arbab, L. Astefanoaei, F. S. d. Boer, M. Sun, and J. Rutten

Abstract:

Reference: B. K. Aichernig, F. Arbab, L. Astefanoaei, F. S. d. Boer, M. Sun, and J. Rutten. Fault-based test case generation for component connectors. In TASE '09: Proceedings of the 2009 Third IEEE International Symposium on Theoretical Aspects of Software Engineering, pages 147-154, Washington, DC, USA, 2009. IEEE Computer Society.